Low Electron Schottky Barrier Height of NiGe/Ge Achieved by Ion Implantation After Germanidation Technique

标题
Low Electron Schottky Barrier Height of NiGe/Ge Achieved by Ion Implantation After Germanidation Technique
作者
关键词
-
出版物
IEEE ELECTRON DEVICE LETTERS
Volume 33, Issue 12, Pages 1687-1689
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2012-11-15
DOI
10.1109/led.2012.2220954

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