4.6 Article

Full-Swing a-IGZO Inverter With a Depletion Load Using Negative Bias Instability Under Light Illumination

期刊

IEEE ELECTRON DEVICE LETTERS
卷 33, 期 12, 页码 1726-1728

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2012.2221454

关键词

Amorphous indium-gallium-zinc-oxide (IGZO); depletion mode; inverter; negative bias illumination temperature stress (NBITS); thin-film transistor (TFT)

资金

  1. National Research Foundation of Korea
  2. Korea government (MEST) [2012-0000622]
  3. National Research Foundation of Korea [핵09A1721, 2008-0062428] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

向作者/读者索取更多资源

A high-performance amorphous indium-gallium-zinc-oxide thin-film transistor (TFT) inverter, which is composed of an enhancement mode driver and a depletion mode load, is implemented by selectively inducing the negative bias illumination temperature stress (NBITS) to the load TFT. Under NBITS, the transfer curve of the load TFT shows a parallel shift into the negative bias direction without a significant change in the subthreshold slope and recovers very slowly after terminating the NBITS even under harsh bias and temperature stress conditions. The proposed inverter shows much improved switching characteristics including higher voltage gain, wider swing range, and higher noise margins compared to the conventional inverter with an enhancement load.

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