Effects of Positive and Negative Stresses on III–V MOSFETs With $\hbox{Al}_{2}\hbox{O}_{3}$ Gate Dielectric

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 32, Issue 4, Pages 488-490

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2011-02-19

DOI

10.1109/led.2011.2106107

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