Size-Dependent Retention Time in NiO-Based Resistive-Switching Memories

Resistance transition in metal oxides induced by electronic threshold switching

(2009) D. Ielmini et al.   APPLIED PHYSICS LETTERS

Common signature of many-body thermal excitation in structural relaxation and crystallization of chalcogenide glasses

(2009) Daniele Ielmini et al.   APPLIED PHYSICS LETTERS

Impact of Electrode Materials on Resistive-Switching Memory Programming

(2009) U. Russo et al.   IEEE ELECTRON DEVICE LETTERS

Modeling of Set/Reset Operations in NiO-Based Resistive-Switching Memory Devices

(2009) Carlo Cagli et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices

(2009) Ugo Russo et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices

(2009) Ugo Russo et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Nanoscale formation mechanism of conducting filaments in NiO thin films

(2009) C.H. Kim et al.   SOLID STATE COMMUNICATIONS

Electrical and thermal transport in single nickel nanowire

(2008) M. N. Ou et al.   APPLIED PHYSICS LETTERS

Reduction in the reset current in a resistive random access memory consisting of NiOx brought about by reducing a parasitic capacitance

(2008) K. Kinoshita et al.   APPLIED PHYSICS LETTERS

Resistance switching in amorphous and crystalline binary oxides grown by electron beam evaporation and atomic layer deposition

(2008) S. Spiga et al.   MICROELECTRONIC ENGINEERING

The missing memristor found

(2008) Dmitri B. Strukov et al.   NATURE

Threshold switching mechanism by high-field energy gain in the hopping transport of chalcogenide glasses

(2008) Daniele Ielmini   PHYSICAL REVIEW B

Electrical properties of NiO films obtained by high-temperature oxidation of nickel

(2007) Salah A. Makhlouf   THIN SOLID FILMS