Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs in the Subthreshold Region

标题
Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs in the Subthreshold Region
作者
关键词
-
出版物
IEEE ELECTRON DEVICE LETTERS
Volume 30, Issue 6, Pages 668-671
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2009-05-27
DOI
10.1109/led.2009.2019975

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