First Insight Into the Lifetime Acceleration Model of High-$k$$\hbox{ZrO}_{2}/\hbox{SiO}_{2}/\hbox{ZrO}_{2}$ Stacks for Advanced DRAM Technology Nodes

出版年份 2009 全文链接

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作者

关键词

出版物

IEEE ELECTRON DEVICE LETTERS

Volume 30, Issue 4, Pages 340-342

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2009-02-10

DOI

10.1109/led.2009.2012520

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