4.6 Article

Dynamic thermal analysis of high-power LEDs at pulse conditions

期刊

IEEE ELECTRON DEVICE LETTERS
卷 29, 期 8, 页码 863-866

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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2008.2000953

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junction temperature; light-emitting diode (LED); peak shift method; pulse condition; transient thermal measurement

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In this letter, the thermal evaluation of high-power LED packages at pulse conditions was reported. A theoretical calculation model was proposed based on the analogy between the thermal and electrical RC circuits. The thermal performance of LED packages driven by pulse input was calculated using the RC network extracted from transient thermal measurement. The junction temperature fluctuation band decreases with the frequency at certain duty cycles. The saturated average junction temperature rise linearly increases with the duty cycle at certain frequencies. These predictions were verified by the real-time junction temperature measurement using the peak shift method at pulse conditions. The theoretical model was found to be effective and applicable to the evaluation of the thermal performance of LEDs working at pulse conditions.

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