A Compact Model for Oxide Breakdown Failure Distribution in Ultrathin Oxides Showing Progressive Breakdown

标题
A Compact Model for Oxide Breakdown Failure Distribution in Ultrathin Oxides Showing Progressive Breakdown
作者
关键词
-
出版物
IEEE ELECTRON DEVICE LETTERS
Volume 29, Issue 8, Pages 949-951
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2008-07-30
DOI
10.1109/led.2008.2001178

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