Sensing Remote Bulk Defects through Resistance Noise in a Large-Area Graphene Field-Effect Transistor

Title
Sensing Remote Bulk Defects through Resistance Noise in a Large-Area Graphene Field-Effect Transistor
Authors
Keywords
-
Journal
ACS Applied Materials & Interfaces
Volume -, Issue -, Pages -
Publisher
American Chemical Society (ACS)
Online
2022-11-03
DOI
10.1021/acsami.2c14499

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started