Sensing Remote Bulk Defects through Resistance Noise in a Large-Area Graphene Field-Effect Transistor
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Title
Sensing Remote Bulk Defects through Resistance Noise in a Large-Area Graphene Field-Effect Transistor
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Keywords
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Journal
ACS Applied Materials & Interfaces
Volume -, Issue -, Pages -
Publisher
American Chemical Society (ACS)
Online
2022-11-03
DOI
10.1021/acsami.2c14499
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