Schottky barrier height measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy

Title
Schottky barrier height measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy
Authors
Keywords
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Journal
AIP Advances
Volume 3, Issue 11, Pages 112110
Publisher
AIP Publishing
Online
2013-11-12
DOI
10.1063/1.4831756

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